Advanced Transmission Electron Microscopy

Advanced Transmission Electron Microscopy

This volume expands and updates the coverage in the authors' popular 1992 book, Electron Microdiffraction. As the title implies, the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy. Special attention is given to electron diffraction and imaging, including high-resolution TEM and STEM imaging, and the application of these methods to crystals, their defects, and nanostructures. The authoritative text summarizes and develops most of the useful knowledge which has been gained over the years from the study of the multiple electron scattering problem, the recent development of aberration correctors and their applications to materials structure characterization, as well as the authors' extensive teaching experience in these areas. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience is ideal for use as an advanced undergraduate or graduate level text in support of course materials in Materials Science, Physics or Chemistry departments.

Download Now

Author
Publisher Springer
Release Date
ISBN 9781493966059
Pages 729 pages
Rating 4/5 (57 users)

More Books:

Advanced Transmission Electron Microscopy
Language: en
Pages: 729
Authors: Jian Min Zuo
Categories: Technology & Engineering
Type: BOOK - Published: 2016-11-24 - Publisher: Springer

This volume expands and updates the coverage in the authors' popular 1992 book, Electron Microdiffraction. As the title implies, the focus of the book has chang
Advanced Transmission Electron Microscopy
Language: en
Pages: 272
Authors: Francis Leonard Deepak
Categories: Technology & Engineering
Type: BOOK - Published: 2015-06-05 - Publisher: Springer

This book highlights the current understanding of materials in the context of new and continuously emerging techniques in the field of electron microscopy. The
Advanced Transmission Electron Microscopy
Language: en
Pages: 729
Authors: Jian Min Zuo
Categories: Technology & Engineering
Type: BOOK - Published: 2016-10-26 - Publisher: Springer

This volume expands and updates the coverage in the authors' popular 1992 book, Electron Microdiffraction. As the title implies, the focus of the book has chang
Advanced Transmission Electron Microscopy Investigation of Nano-clustering in Gd-doped GaN
Language: en
Pages: 169
Authors: Mingjian Wu
Categories:
Type: BOOK - Published: 2014 - Publisher:

Characterization of Metal-organic Frameworks and Other Porous Materials Via Advanced Transmission Electron Microscopy
Language: en
Pages: 149
Transmission Electron Microscopy and Diffractometry of Materials
Language: en
Pages: 775
Authors: Brent Fultz
Categories: Science
Type: BOOK - Published: 2012-10-14 - Publisher: Springer Science & Business Media

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. T
Scanning Transmission Electron Microscopy
Language: en
Pages: 162
Authors: Alina Bruma
Categories: Technology & Engineering
Type: BOOK - Published: 2020-12-22 - Publisher: CRC Press

Scanning Transmission Electron Microscopy: Advanced Characterization Methods for Materials Science Applications The information comprised in this book is focuse
Characterisation of Thin SiC Films and Low Dimensional Structures in SiC Using Advanced Transmission Electron Microscopy
Language: en
Pages: 166
Scanning Transmission Electron Microscopy
Language: en
Pages: 762
Authors: Stephen J. Pennycook
Categories: Technology & Engineering
Type: BOOK - Published: 2011-03-22 - Publisher: Springer

Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of th
Progress in Transmission Electron Microscopy 2
Language: en
Pages: 342
Authors: Xiao-Feng Zhang
Categories: Science
Type: BOOK - Published: 2001-10-18 - Publisher: Springer Science & Business Media

Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and internation